Migration of compensating defects in p-type ZnSe during annealing

Applied Physics Letters

Volumn 68, Issue 11, 1996, Pages 1522-1524

  Chen, Anthony L ^a   Walukiewicz, Wladek ^a   Duxstad, Kristin ^a,b   Haller, Eugene E ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b University of California ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000028324     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115686     Document Type: Article

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