Macroscopic quantum tunneling and qubit design parameters of Bi 2Sr2CaCu2O8+δ surface intrinsic Josephson junctions

Superconductor Science and Technology

Volumn 21, Issue 12, 2008, Pages

  Cui, D J ^a,b   Yu, H F ^a   Peng, Z H ^a   Cao, W H ^a   Zhu, X B ^a   Tian, Ye ^a   Chen, G H ^a   Lin, D H ^b   Gu, C Z ^a   Zheng, D N ^a   Jing, X N ^a   Lu, Li ^a   Zhao, S P ^a  

^a INSTITUTE OF PHYSICS   (China)

^b CHONGQING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); JOSEPHSON JUNCTION DEVICES; QUANTUM OPTICS;

CRITICAL CURRENT DENSITIES; CROSS OVERS; CROSSOVER REGIMES; DESIGN PARAMETERS; JOSEPHSON JUNCTIONS; MACROSCOPIC QUANTUM TUNNELING; QUANTUM CORRECTIONS; SWITCHING CURRENT DISTRIBUTIONS;

ELECTRON TUNNELING;

EID: 58149528357     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/21/12/125019     Document Type: Article

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