Fast BDD truncation method for efficient top event probability calculation

Nuclear Engineering and Technology

Volumn 40, Issue 7, 2008, Pages 571-580

  Jung, Woo Sik ^a   Han, Sang Hoon ^a   Yang, Joon Eon ^a  

^a Korea Atomic Energy Research Institute   (South Korea)

Author keywords

BDD; Binary Decision Diagram; Fault Tree; Top event probability; Truncation

Indexed keywords

EID: 58149265048     PISSN: 17385733     EISSN: None     Source Type: Journal    
DOI: 10.5516/NET.2008.40.7.571     Document Type: Article

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