Ultra-low breakdown voltage and origin of 1/f2 noise in metallic nanorod arrays

Nanotechnology

Volumn 19, Issue 44, 2008, Pages

  Carvalho, Daniel ^a   Ghosh, Shankar ^a   Banerjee, Rajarshi ^b   Ayyub, Pushan ^a  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^b UNIVERSITY OF NORTH TEXAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; IONIZATION OF GASES; SLIP FORMING;

BREAK DOWN VOLTAGES; CONDUCTANCE NOISES; CONDUCTION MECHANISMS; COPPER NANORODS; DC VOLTAGES; FIELD EVAPORATIONS; IN-SITU; LOCAL FIELDS; METALLIC NANORODS; NANOROD ARRAYS; PARALLEL ELECTRODES; SLIDING FRICTIONS; SPACE CHARGES;

NANORODS;

COPPER; METAL; NANOROD;

ARTICLE; ATOM; CONTROLLED STUDY; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRODE; NOISE; NONHUMAN; PRIORITY JOURNAL;

EID: 58149260472     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/44/445713     Document Type: Article

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