Thickness dependence of the microstructures and magnetic properties of electroplated Co nanowires

Nanotechnology

Volumn 20, Issue 4, 2009, Pages

  Ye, Zuxin ^a   Liu, Haidong ^a   Luo, Zhiping ^b   Lee, Han Gil ^a   Wu, Wenhao ^a   Naugle, D G ^a   Lyuksyutov, I ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b Texas AandM University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRIC WIRE; ELECTROCHEMISTRY; MAGNETIC FORCE MICROSCOPY; MAGNETIC MATERIALS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MAGNETISM; MICROSTRUCTURE; NANOWIRES;

ANODIC ALUMINUM OXIDE MEMBRANES; DIFFERENT MICROSTRUCTURES; MAGNETIC FORCES; MAGNETIZATION MEASUREMENTS; PROPERTIES AND MICROSTRUCTURES; SELECTED AREA ELECTRON DIFFRACTIONS; SUB MICRONS; THICKNESS DEPENDENCES; X-RAY DIFFRACTIONS;

COBALT;

ALUMINUM OXIDE; COBALT; NANOWIRE;

ARTICLE; CORRELATION ANALYSIS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; HYSTERESIS; MAGNETISM; MEMBRANE; MICROSCOPY; PRIORITY JOURNAL; THICKNESS; X RAY DIFFRACTION;

EID: 58149236748     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/4/045704     Document Type: Article

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