X-ray diffraction study of gold nitride films: Observation of a solid solution phase

Journal of Applied Physics

Volumn 104, Issue 11, 2008, Pages

  Alves, L ^a   Hase, T P A ^b   Hunt, M R C ^c   Brieva, A C ^a   Siller L ^a  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; DIFFRACTION; DISSOLUTION; ETCHING; GOLD; NITRIDES; NITROGEN; PHOTOELECTRON SPECTROSCOPY; PLASMA ETCHING; REACTIVE ION ETCHING; SOLID SOLUTIONS; SOLIDIFICATION; SPUTTERING; X RAY ANALYSIS; X RAY DIFFRACTION;

GOLD FILMS; GOLD NITRIDES; INTERSTITIAL NITROGENS; LATTICE PARAMETERS; NITROGEN ATOMS; NITROGEN PLASMAS; REACTIVE IONS; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 58149213842     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3040717     Document Type: Article

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