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Volumn 72, Issue 2, 2009, Pages 285-290
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Structural and optical investigation of semiconductor CdSe/CdS core-shell quantum dot thin films
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Author keywords
Optical absorption spectroscopy; Semiconductor quantum dots; Transmission electron microscopy (TEM); X ray diffraction studies (XRD)
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Indexed keywords
ABSORPTION;
AUGER ELECTRON SPECTROSCOPY;
DIFFRACTION;
ELECTRIC CONDUCTIVITY;
ELECTROMAGNETIC WAVE ABSORPTION;
ELECTRON MICROSCOPES;
ENERGY ABSORPTION;
INTEGRATED OPTOELECTRONICS;
LIGHT;
LIGHT ABSORPTION;
LUMINESCENCE;
OPTICAL MICROSCOPY;
OPTICAL WAVEGUIDES;
OXIDE FILMS;
QUANTUM ELECTRONICS;
SEMICONDUCTING INDIUM;
SEMICONDUCTOR MATERIALS;
SEMICONDUCTOR QUANTUM DOTS;
TIN;
TITANIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
BAND EDGES;
CDSE/CDS;
COATED GLASS SUBSTRATES;
CORE SHELLS;
CORE-SHELL STRUCTURES;
IN-SITU;
INDIUM TIN OXIDES;
INDUCED STRAINS;
OPTICAL ABSORPTION SPECTROSCOPY;
OPTICAL INVESTIGATIONS;
QUANTUM CONFINEMENT EFFECTS;
QUANTUM DOT THIN FILMS;
QUANTUM DOTS;
SEMI-CONDUCTORS;
STRONG ENHANCEMENTS;
SYNTHESIS ROUTES;
X-RAY DIFFRACTION STUDIES (XRD);
ABSORPTION SPECTROSCOPY;
CADMIUM;
QUANTUM DOT;
SELENIUM;
SULFUR;
TIN DERIVATIVE;
TIN DIOXIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
MATERIALS TESTING;
OPTICS;
SEMICONDUCTOR;
SURFACE PROPERTY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
CADMIUM;
MATERIALS TESTING;
MICROSCOPY, ATOMIC FORCE;
MICROSCOPY, ELECTRON, TRANSMISSION;
OPTICS AND PHOTONICS;
QUANTUM DOTS;
SELENIUM;
SEMICONDUCTORS;
SULFUR;
SURFACE PROPERTIES;
TIN COMPOUNDS;
X-RAY DIFFRACTION;
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EID: 58149195146
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2008.09.031 Document Type: Article |
Times cited : (20)
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References (24)
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