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Volumn 72, Issue 2, 2009, Pages 285-290

Structural and optical investigation of semiconductor CdSe/CdS core-shell quantum dot thin films

Author keywords

Optical absorption spectroscopy; Semiconductor quantum dots; Transmission electron microscopy (TEM); X ray diffraction studies (XRD)

Indexed keywords

ABSORPTION; AUGER ELECTRON SPECTROSCOPY; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTROMAGNETIC WAVE ABSORPTION; ELECTRON MICROSCOPES; ENERGY ABSORPTION; INTEGRATED OPTOELECTRONICS; LIGHT; LIGHT ABSORPTION; LUMINESCENCE; OPTICAL MICROSCOPY; OPTICAL WAVEGUIDES; OXIDE FILMS; QUANTUM ELECTRONICS; SEMICONDUCTING INDIUM; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; TIN; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 58149195146     PISSN: 13861425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.saa.2008.09.031     Document Type: Article
Times cited : (20)

References (24)
  • 16
    • 58149203695 scopus 로고    scopus 로고
    • JCPD file no Hex 06-0314, Published by Joint Committee on Powder Diffraction Standards, Pennsylvania, USA, 1974.
    • JCPD file no Hex 06-0314, Published by Joint Committee on Powder Diffraction Standards, Pennsylvania, USA, 1974.
  • 17
    • 58149198662 scopus 로고    scopus 로고
    • JCPD file no Hex 10-0454, Published by Joint Committee on Powder Diffraction Standards, Pennsylvania, USA, 1974.
    • JCPD file no Hex 10-0454, Published by Joint Committee on Powder Diffraction Standards, Pennsylvania, USA, 1974.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.