Infrared and Raman spectroscopic study of Sn-containing Zn/Al-layered double hydroxides

Journal of Optoelectronics and Advanced Materials

Volumn 10, Issue 12, 2008, Pages 3477-3481

  Seftel, E M ^a,b   Popovici, E ^a   Mertens, M ^c   Cool, P ^b   Vansant, E F ^b  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b UNIVERSITY OF ANTWERP   (Belgium)

^c FLEMISH INSTITUTE FOR TECHNOLOGICAL RESEARCH VITO   (Belgium)

Author keywords

FT IR spectroscopy; Isomorphic substitution; Layered double hydroxides; Raman spectroscopy; Sn containing

Indexed keywords

POSITIVE IONS; PRECIPITATION (CHEMICAL); RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPACECRAFT INSTRUMENTS; SPECTROSCOPIC ANALYSIS; ZINC COMPOUNDS; ZINC METALLOGRAPHY;

COMPONENT ANALYSIS; COPRECIPITATION METHOD; FTIR SPECTROSCOPY; INFRARED AND RAMAN SPECTRA; ISOMORPHIC SUBSTITUTION; LAYERED DOUBLE HYDROXIDES; RAMAN SPECTROSCOPIC STUDY; TETRAVALENT CATIONS;

TIN METALLOGRAPHY;

EID: 58149161975     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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