Study of passive films formed on Sn in the 7-14 pH range

Journal of Electroanalytical Chemistry

Volumn 504, Issue 2, 2001, Pages 175-183

  Moina, C A ^a   Ybarra, G O ^a  

^a INSTITUTO NACIONAL DE TECNOLOGÍA INDUSTRIAL   (Argentina)

Author keywords

FTIR spectroscopy; Passive oxide layers; Photocurrent spectroscopy; Semiconductor properties; Tin

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; ELECTRONIC PROPERTIES; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROXYLATION; MORPHOLOGY; PH EFFECTS; PHOTOCURRENTS; TIN; WATER;

FOURIER TRANSFORM INFRARED REFLECTION ABSORPTION SPECTROSCOPY; PASSIVE FILMS; PHOTOCURRENT SPECTROSCOPY;

SEMICONDUCTING FILMS;

EID: 0035906444     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(01)00432-6     Document Type: Article

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