Capacitance and resistance measurements of SnO 2 thick-films

Journal of Materials Science: Materials in Electronics

Volumn 20, Issue 1, 2009, Pages 25-32

  Ponce, Miguel Adolfo ^a   Castro, Miriam S ^a   Aldao, Celso M ^a  

^a UNIVERSIDAD NACIONAL DE MAR DEL PLATA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

AIR ATMOSPHERES; DEEP TRAPS; ELECTRICAL BEHAVIORS; EQUIVALENT CIRCUIT MODELS; EXPERIMENTAL RESPONSES; IMPEDANCE SPECTROSCOPIES; RESISTANCE ANALYSES; RESISTANCE MEASUREMENTS; TRAP STATES;

CRYSTAL GROWTH; GRAIN BOUNDARIES; THICK FILMS;

CAPACITANCE;

EID: 58149111267     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-008-9590-8     Document Type: Article

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