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Microelectronics Reliability

Volumn 49, Issue 1, 2009, Pages 51-58

Stability of thin film resistors - Prediction and differences base on time-dependent Arrhenius law

(1) Kuehl, Reiner W a

a Vishay (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FORECASTING; RESISTORS; THIN FILM DEVICES; THIN FILMS;

ABSOLUTE STABILITIES; ARRHENIUS LAWS; ARRHENIUS' EQUATIONS; DRIFT POTENTIALS; ELECTRONIC INDUSTRIES; INFLUENCING PARAMETERS; ON TIMES; STABILITY PREDICTIONS; TEMPERATURE DEPENDENCES; THIN FILM RESISTORS;

SOLIDS;

EID: 58149108951 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/j.microrel.2008.10.013 Document Type: Article

Times cited : (20)

References (10)

1
- 58149135396
- Kuehl RW. Piezoresistive effects on chip resistor application in SMT. In: Proceedings CARTS-Europe '98; 1998. p. 83-91.
- Kuehl RW. Piezoresistive effects on chip resistor application in SMT. In: Proceedings CARTS-Europe '98; 1998. p. 83-91.

2
- 0020873374
- Coleman M. Ageing mechanism and stability in thick film resistors. In: Proceedings of the Fourth European Hybrid Microelectronics Conference, Copenhagen (Denmark); May 1983. p. 20-30.
- Coleman M. Ageing mechanism and stability in thick film resistors. In: Proceedings of the Fourth European Hybrid Microelectronics Conference, Copenhagen (Denmark); May 1983. p. 20-30.

3
- 0024104882
- 3 - examples of chemically reactive and unreactive systems
- 3 - examples of chemically reactive and unreactive systems. Microelectron J 19 6 (1989) 24-42
- (1989) Microelectron J , vol.19 , Issue.6 , pp. 24-42
- Dziedzic, A.¹

4
- 0025444963
- Stability of tantalum nitride thin film resistors
- Au C.L., Anderson W.A., Schmitz D.A., Flassayer J.C., and Collins F.M. Stability of tantalum nitride thin film resistors. J Mater Res 5 (1990) 1224-1232
- (1990) J Mater Res , vol.5 , pp. 1224-1232
- Au, C.L.¹ Anderson, W.A.² Schmitz, D.A.³ Flassayer, J.C.⁴ Collins, F.M.⁵

5
- 0009037619
- A new approach to the study of the intrinsic ageing kinetics of thick film resistors
- De Schepper L., De Ceuninck W., Stulens H., Stals L.M., Vanden Berghe R., and Demolder S. A new approach to the study of the intrinsic ageing kinetics of thick film resistors. Hybrid Circuits 23 (1990) 5-13
- (1990) Hybrid Circuits , vol.23 , pp. 5-13
- De Schepper, L.¹ De Ceuninck, W.² Stulens, H.³ Stals, L.M.⁴ Vanden Berghe, R.⁵ Demolder, S.⁶

6
- 0028194702
- Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
- De Schepper L., De Ceuninck W., Lekens G., Stals L.M., Vanhecke B., Roggen J., et al. Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics. Qual Reliab Int 10 (1994) 15-26
- (1994) Qual Reliab Int , vol.10 , pp. 15-26
- De Schepper, L.¹ De Ceuninck, W.² Lekens, G.³ Stals, L.M.⁴ Vanhecke, B.⁵ Roggen, J.⁶

7
- 0004214389
- VCH Publishers p. 63-4
- Connors K. Chemical kinetics (1990), VCH Publishers p. 63-4
- (1990) Chemical kinetics
- Connors, K.¹

8
- 58149128379
- Dr. Dietrich Steinkopf Verlag, Darmstadt p. 241-61
- Ulich-Jost. "IV Chemische Kinetik" (German), Kurzes Lehrbuch der physikalischen Chemie (1970), Dr. Dietrich Steinkopf Verlag, Darmstadt p. 241-61
- (1970) "IV Chemische Kinetik" (German), Kurzes Lehrbuch der physikalischen Chemie
- Ulich-Jost¹

9
- 58149124503
- Hüthig Verlag, Heidelberg p. 38-45
- Ackmann W. Prüfung der Zuverlässigkeit (German), Zuverlässigkeit elektronischer Bauelemente (1976), Hüthig Verlag, Heidelberg p. 38-45
- (1976) Prüfung der Zuverlässigkeit (German), Zuverlässigkeit elektronischer Bauelemente
- Ackmann, W.¹

10
- 51349168175
- SciTech Publishing Inc., Park Ridge [NJ]
- Zandman F., Simon P.-R., and Szwarc J. Resistor theory and technology (2001), SciTech Publishing Inc., Park Ridge [NJ]
- (2001) Resistor theory and technology
- Zandman, F.¹ Simon, P.-R.² Szwarc, J.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.