AGEING MECHANISMS AND STABILITY IN THICK FILM RESISTORS.

Proceedings - European Hybrid Microelectronics Conference

Volumn , Issue , 1983, Pages 20-30

  Coleman, Martin ^a  

^a Standard Telecommunication Laboratories Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION; DIFFUSION;

ACCELERATED AGING; AGING MECHANISMS; STRESS RELIEF;

RESISTORS;

EID: 0020873374     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)