Properties of thin silver films with different thickness

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 41, Issue 3, 2009, Pages 387-390

  Zhao, Pei ^a   Su, Weitao ^b   Wang, Reng ^a   Xu, Xiaofeng ^c   Zhang, Fengshan ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b HANGZHOU DIANZI UNIVERSITY   (China)

^c DONGHUA UNIVERSITY   (China)

Author keywords

Broad band filter; Crystal structure; Optical constants; Silver film

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; LIGHT; MAGNETIC FILMS; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MULTILAYER FILMS; MULTILAYERS; OPTICAL CONSTANTS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; SILVER; SPECTRUM ANALYZERS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; ZINC SULFIDE;

BROAD BAND FILTER; ELECTRICAL AND OPTICAL PROPERTIES; FLOAT GLASSES; OPTICAL AND ELECTRICAL PROPERTIES; OPTIMUM THICKNESSES; SILVER FILM; THIN SILVER FILMS; X-RAY DIFFRACTIONS; ZNS FILMS;

OPTICAL FILMS;

EID: 58149091137     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2008.08.062     Document Type: Article

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