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Volumn 11, Issue 6, 2003, Pages 589-600

Microstructural evolution of PST-TiAl during low-rate compressive micro-straining at 1023 K in hard and soft orientations

Author keywords

A. Titanium aluminides, based on TiAl; B. Creep; B. Mechanical properties at elevated temperature; D. Microstructure, evolution of microstructure; F. Electron microscopy, scanning and transmission

Indexed keywords

ANISOTROPY; INTERFACES (MATERIALS); MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION;

EID: 0038183952     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(03)00048-7     Document Type: Article
Times cited : (10)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.