Investigation of 1,1-dichloroethene interacting with the Si(1 1 1)-7 × 7 surface studied by scanning tunneling microscopy

Surface Science

Volumn 603, Issue 1, 2009, Pages 84-90

  Andersen, T H ^a   Svenum, I H ^a   Gabrielsen, A ^a   Borg, A ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

1,1 dichloroethene; Chemisorption; Rest atom; Scanning tunneling microscopy; Silicon

Indexed keywords

ADATOMS; ADSORPTION; ATOMIC PHYSICS; ATOMS; BIAS VOLTAGE; CHEMISORPTION; SCANNING TUNNELING MICROSCOPY; TUNNELING (EXCAVATION);

1,1-DICHLOROETHENE; CL ATOMS; HALF UNIT CELLS; NEGATIVE SAMPLE BIASES; REST ATOM; SINGLE BONDS;

SCANNING;

EID: 58049142473     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.10.032     Document Type: Article

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