Contactless testing of the surface of materials;Berührungsfreie Prüfung von Materialoberflächen mit THz-Strahlung

Technisches Messen

Volumn 75, Issue 1, 2008, Pages 45-50

  Hils, Bernd ^a   Von Spiegel, Wolff ^b   Löffler, Torsten ^b   Roskos, Hartmut G ^b  

^a GOETHE UNIVERSITY   (Germany)

^b NONE

Author keywords

Heterodyne; Profilometry; Surface metrology; THz imaging

Indexed keywords

HYBRID TECHNIQUES; REFLECTOMETRY; SENSING AND IMAGING; SURFACE METROLOGY; SURFACE OF MATERIALS; THZ IMAGING; THZ RADIATION; WAVELENGTH REGIMES;

PROFILOMETRY; SURFACE ROUGHNESS;

HETERODYNING;

EID: 58049124292     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: 10.1524/teme.2008.0847     Document Type: Article

References (8)

1. www.qinetiq.com; www.tadarvision.com; www.thruvision.com.
2. T. Löffler, T. Bauer, K. Siebert, H. G. Roskos, A. Fitzgerald, and S. Czasch: Terahertz dark-field imaging of biomedical tissue. In: Optics Express 9, 616 (2001).
3. N. Hasegawa, T. Löffler, M. Thomson and H. G. Ros- kos: Remote identification of protrusions and dents on surfaces by terahertz reflectometry with spatial beam filtering and out-of-focus detection. In: App. Phys. 83, 3996 (2003).
4. Q. Wu, T. D. Hewitt, and X.-C. Zhang: Two- dimensional electro-optic imaging of THz beams. In: Appl. Phys. Lett. 69, 1026 (1996).
5. A. Nahata, J. T. Yardley, and T. F. Heinz: Two- dimensional imaging of continuous-wave terahertz radiation using electro-optic detection. In: Appl. Phys. Lett. 81, 963 (2002).
6. T. Löffler, T. Pfeifer, H. G. Roskos, and H. Kurz: Stable optoelectronic detection of free-running microwave signals with 150-GHz bandwidth. In: Microelectronic Engineering 31, 397 (1996).
7. T. Löffler, T. May, C. am Weg, A. Alcin, B. Hils and H. G. Roskos: Continuous-wave terahertz imaging with a hybrid system. In: Appl. Phys. Lett. 90, 091111 (2007).
8. P. L. Heydemann: Determination and correction of quadrature fringe measurement errors in interferometers. In: Applied Optics 20, 3382 (1981).