Creep in nanocrystalline Ni during X-ray diffraction

Scripta Materialia

Volumn 60, Issue 5, 2009, Pages 297-300

  Van Petegem, S ^a   Brandstetter, S ^a   Schmitt, B ^a   Van Swygenhoven, H ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Creep; Nanocrystalline materials; Nickel; X ray diffraction (XRD)

Indexed keywords

CREEP; DIFFRACTION; NANOCRYSTALLINE ALLOYS; NICKEL; NICKEL ALLOYS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CREEP MECHANISMS; CREEP STRESS LEVELS; CREEP STRESSES; DIFFRACTION PEAKS; IN-SITU; NANOCRYSTALLINE; PEAK PROFILES; PEAK WIDTHS; X-RAY DIFFRACTION (XRD);

NANOCRYSTALLINE MATERIALS;

EID: 57949107004     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.10.034     Document Type: Article

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