Characterization, simulation, and modeling of FET source/drain diffusion resistance

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2008, Pages 281-284

  Lu, Ning ^a   Dewey, Bill ^b  

^a IBM RESEARCH   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; INTEGRATED CIRCUITS; MESFET DEVICES;

AND MODELING; AND MODELS; COMPREHENSIVE APPROACHES; DIFFUSION RESISTANCES; PARAMETER VALUES; PARASITIC RESISTANCES; SIMULATION RESULTS; SOI TECHNOLOGIES; SOURCE AND DRAINS; SPICE MODELS; TESTING STRUCTURES;

FIELD EFFECT TRANSISTORS;

EID: 57849152994     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2008.4672076     Document Type: Conference Paper

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