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Volumn 44, Issue 14, 2008, Pages 1520-1530

Application of electron microscopy and x-ray structural analysis for the determination of sizes of structural elements in nanocrystalline materials (review)

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Indexed keywords


EID: 57849142570     PISSN: 00201685     EISSN: 16083172     Source Type: Journal    
DOI: 10.1134/S0020168508140070     Document Type: Review
Times cited : (22)

References (46)
  • 7
    • 0036017820 scopus 로고    scopus 로고
    • issue65. [Phys. Sol. State (Engl. Transl.), 2002, vol. 44, issue 6, no. 5, pp. 1003-1007]
    • G.E. Abrosimova A.S. Aronin 2002 Fiz. Tverd. Tela 44 issue65 961 965 [Phys. Sol. State (Engl. Transl.), 2002, vol. 44, issue 6, no. 5, pp. 1003-1007]
    • (2002) Fiz. Tverd. Tela , vol.44 , pp. 961-965
    • Abrosimova, G.E.1    Aronin, A.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.