Measuring light reflectance of BGO crystal surfaces

IEEE Transactions on Nuclear Science

Volumn 55, Issue 5, 2008, Pages 2443-2449

  Janecek, Martin ^a   Moses, William W ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Lambertian reflection; Light collection; Monte Carlo methods; Scintillation crystal

Indexed keywords

CRYSTALS; ELECTRIC CURRENT MEASUREMENT; FABRICS; HETEROJUNCTION BIPOLAR TRANSISTORS; IMAGE SEGMENTATION; LIGHT EMISSION; LIGHT REFLECTION; LUMINESCENCE; MATHEMATICAL MODELS; MONTE CARLO METHODS; PHOTODIODES; REFLECTION; SCINTILLATION; SCINTILLATION COUNTERS; SURFACE ROUGHNESS; TITANIUM; TITANIUM DIOXIDE;

ARBITRARY ANGLES; BGO CRYSTALS; CURRENT MEASUREMENTS; DIGITAL MULTIMETER; DYNAMIC RANGES; ETCHED SURFACES; HEMISPHERICAL SHAPES; INCIDENCE ANGLES; INNER SURFACES; LAMBERTIAN; LAMBERTIAN REFLECTION; LIGHT COLLECTION; LIGHT REFLECTANCES; LINEAR COMBINATIONS; MECHANICALLY POLISHED SURFACES; MONTE CARLO MODELS; MONTE CARLO SIMULATIONS; PHOTODIODE ARRAYS; POLISHED SURFACES; REFLECTION DISTRIBUTIONS; SCINTILLATING CRYSTALS; SCINTILLATION CRYSTAL; SET-UPS; SOLID ANGLES; SPECULAR REFLECTIONS; SURFACE FINISHES; SURFACE REFLECTANCES;

SURFACE PROPERTIES;

EID: 57849138970     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2003253     Document Type: Article

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