Optical reflectance measurements for commonly used reflectors

IEEE Transactions on Nuclear Science

Volumn 55, Issue 4, 2008, Pages 2432-2437

  Janecek, Martin ^a   Moses, William W ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Lambertian reflection; Light collection; Monte Carlo methods

Indexed keywords

ANGULAR DISTRIBUTION; CAVITY RESONATORS; ELECTRIC CURRENT MEASUREMENT; HETEROJUNCTION BIPOLAR TRANSISTORS; LASERS; MULTIPLEXING; MULTIPLEXING EQUIPMENT; PHOTODIODES; REFLECTION; SCINTILLATION COUNTERS; SILICON;

ANGLE-OF-INCIDENCE; ANGULAR RESOLUTIONS; CURRENT MEASUREMENTS; DATA COLLECTIONS; DIFFUSE REFLECTANCE; DIGITAL MULTIMETER; DYNAMIC RANGE; LAMBERTIAN REFLECTION; LIGHT COLLECTION; LIGHT REFLECTANCE; MONTE CARLO METHODS; OPTICAL LIGHT; OPTICAL REFLECTANCE; OUTPUT POWERS; PHOTO DIODE ARRAYS; POLARIZED LASERS; POSITION ACCURACY; PROGRAM CONTROLS; SILICON PHOTODIODES; SOLID ANGLES;

ELECTROMAGNETIC WAVES;

EID: 53349108781     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2001408     Document Type: Conference Paper

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