Migration of charged defects in local depolarization fields as a mechanism of aging in ferroelectrics

Ferroelectrics

Volumn 370, Issue 1 PART 4, 2008, Pages 196-202

  Genenko, Y A ^a   Balke, N ^b   Lupascu, D C ^c  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b Lawrence Berkeley National Laboratory   (United States)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC TIME; CHARGE CARRIER DENSITY; CHARGED DEFECTS; CLAMPING PRESSURE; COERCIVE STRESS; DEFECT DIPOLES; DEPOLARIZATION FIELDS; DRIVEN DIFFUSION; NUMERICAL STUDIES; POTENTIAL PROBLEMS; QUASI-STATIC; SPACE CHARGES; TWO DIMENSIONAL MODEL;

DEFECTS; FERROELECTRICITY; GRAIN BOUNDARIES; OXIDE MINERALS; PEROVSKITE; POINT DEFECTS;

CARRIER MOBILITY;

EID: 57749206704     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190802381563     Document Type: Conference Paper

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