Corrosion behavior of parylene-metal-parylene thin films in saline

ECS Transactions

Volumn 11, Issue 18, 2008, Pages 1-6

  Li, W ^a   Rodger, D C ^a,b   Menon, P R ^a   Tai, Y C ^a  

^a California Institute of Technology   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSIVE EFFECTS;

ACTIVE CONDITIONS; CONDITION; CORROSION BEHAVIOUR; ELECTRON-BEAM; FAILURE MECHANISM; OPTICAL BEAMS; PARYLENE C; PARYLENES; THIN FILM RESISTORS; THIN-FILMS;

THIN FILMS;

EID: 57749171372     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2897437     Document Type: Conference Paper

References (7)

1. U. Kamachi Mudali, T. M. Sridhar, and Baldev Raj, Sadhana, 28, 601 (2003).
2. L. Wolgemuth, Medical Device & Diagnostic Industry, 22, 42 (2000).
3. Y. C. Tai, F. K. Jiang, Y. Xu, M. Liger, S. Ho, and C. M. Ho, Proc. Pacific Rim MEMS Workshop, Xiamen, China, (2002).
4. D. C. Rodger, W. L, H. Ameri, A. Ray, J. D. Weiland, M. S. Humayun, and Y. C. Tai, Proc. IEEE-NEMS 2006, Zhuhai, China (2006).
5. W. Li, D. C. Rodger, E. Meng, J. D. Weiland, M. S. Humayun, and Y. C. Tai, Proc. IEEE-EMBS Special Topic Conference on Microtechnologies in Medicine and Biology, Okinawa, Japan, 105 (2006).
6. th Annual Conference of the International FES Society Montreal, Canada, (2005).
7. M. Kazemi, E. Basham, M. Sivaprakasam, G. Wang, D. C. Rodger, J. D. Weiland, Y. C. Tai, W. Liu and M. Humayun, Proc. IEEE-EMBS 2004, San Francisco, CA, 4093 (2004).