Growth and characterization of vertically aligned densely packed TiO 2 nanocrystals on sapphire(100) via metal-organic chemical vapor deposition

ECS Transactions

Volumn 11, Issue 11, 2007, Pages 19-25

  Chen, C A ^a   Korotcov, A ^a,d   Chen, Y M ^a   Huang, Y S ^a   Tsai, D S ^a   Tiong, K K ^b   Liao, P C ^c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c TECHNOLOGY AND SCIENCE INSTITUTE OF NORTHERN TAIWAN   (Taiwan)

^d HOWARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION MICROSCOPES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDUSTRIAL CHEMICALS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; NANOCRYSTALS; ORGANIC CHEMICALS; ORGANOMETALLICS; OXIDE MINERALS; RAMAN SCATTERING; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

A3. METAL ORGANIC CHEMICAL VAPOR DEPOSITION (MOCVD); FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GROWTH CONDITIONS; MICRO-RAMAN SCATTERING; SPECTROSCOPIC PROPERTY; TIO2 NANOCRYSTALS; TITANIUM TETRAISOPROPOXIDE; VERTICALLY ALIGNED;

TITANIUM DIOXIDE;

EID: 57749169042     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2889404     Document Type: Conference Paper

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