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Volumn , Issue , 2008, Pages

Standard measurement of interharmonics in a power supply system while evaluating obnoxiousness of a flicker

Author keywords

IEC flickermeter; Interharmonics; Modeling; PstIndicator; Power quality

Indexed keywords

ELECTRIC MEASURING INSTRUMENTS; ELECTRIC POWER SYSTEMS; FLICKERING; HARMONIC ANALYSIS; STANDARDS;

EID: 57749096218     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICHQP.2008.4668841     Document Type: Conference Paper
Times cited : (4)

References (15)
  • 1
    • 57749090098 scopus 로고    scopus 로고
    • IEV number 161-08-13: Flicker.
    • IEV number 161-08-13: Flicker.
  • 2
    • 57749084103 scopus 로고    scopus 로고
    • IEV number 161-08-14
    • IEV number 161-08-14: Flickermeter.
    • Flickermeter
  • 5
    • 57749103591 scopus 로고    scopus 로고
    • W. Mombauer, Flicker caused by interharmonics, etzArchiv, 12, n. 12, pp. 391-396, Dec. 1990.
    • W. Mombauer, "Flicker caused by interharmonics", etzArchiv, vol. 12, n. 12, pp. 391-396, Dec. 1990.
  • 9
    • 27144507057 scopus 로고    scopus 로고
    • Deficiency of the IEC Flicker Meter for Measuring Interharmonic-Caused Voltage Flickers
    • June
    • W. Xu, "Deficiency of the IEC Flicker Meter for Measuring Interharmonic-Caused Voltage Flickers", in Proc. Power Engineering Society General Meeting, vol. 3, n. 12, pp. 2326-2329, June 2005.
    • (2005) Proc. Power Engineering Society General Meeting , vol.3 , Issue.12 , pp. 2326-2329
    • Xu, W.1
  • 12
    • 0346707417 scopus 로고    scopus 로고
    • On the Processing of Harmonics and Interharmonics: Using Hanning Window in Standard Framework
    • Jan
    • A. Testa, D. Gallo, R. Langella, "On the Processing of Harmonics and Interharmonics: Using Hanning Window in Standard Framework", IEEE Trans. Power Del., vol. 19, n. 1, pp. 28-34, Jan. 2004.
    • (2004) IEEE Trans. Power Del , vol.19 , Issue.1 , pp. 28-34
    • Testa, A.1    Gallo, D.2    Langella, R.3
  • 13
    • 0037250667 scopus 로고    scopus 로고
    • Theoretical Assessment of Light Flicker Caused by Sub- and Interharmonic Frequencies
    • Jan
    • T. Keppler, N.R. Watson, J. Arrillaga, S. Chen, "Theoretical Assessment of Light Flicker Caused by Sub- and Interharmonic Frequencies", IEEE Trans. Power Del., vol. 18, n. 1, pp. 329-333, Jan. 2003.
    • (2003) IEEE Trans. Power Del , vol.18 , Issue.1 , pp. 329-333
    • Keppler, T.1    Watson, N.R.2    Arrillaga, J.3    Chen, S.4
  • 15
    • 54049088681 scopus 로고    scopus 로고
    • Sectional approximation of flickermeter transformation characteristic for deformed modulating signal
    • 6 p, Oct
    • G. Wiczyński, "Sectional approximation of flickermeter transformation characteristic for deformed modulating signal", in Proc. XII Int. Conf. on Harmonics and Quality of Power ICHQP 2006, 6 p., Oct. 2006.
    • (2006) Proc. XII Int. Conf. on Harmonics and Quality of Power ICHQP 2006
    • Wiczyński, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.