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1
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57749090098
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IEV number 161-08-13: Flicker.
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IEV number 161-08-13: Flicker.
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2
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57749084103
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IEV number 161-08-14
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IEV number 161-08-14: Flickermeter.
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Flickermeter
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5
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57749103591
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W. Mombauer, Flicker caused by interharmonics, etzArchiv, 12, n. 12, pp. 391-396, Dec. 1990.
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W. Mombauer, "Flicker caused by interharmonics", etzArchiv, vol. 12, n. 12, pp. 391-396, Dec. 1990.
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6
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84861411685
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Light Flicker Prediction Based on Voltage Spectral Analysis
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6 p, Sep
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D. Gallo, R. Langela, A. Testa, "Light Flicker Prediction Based on Voltage Spectral Analysis", in Proc. IEEE Porto Power Tech. Conference PPT2001, vol. 1, 6 p., Sep. 2001.
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(2001)
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Gallo, D.1
Langela, R.2
Testa, A.3
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7
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19644374926
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IEC Flickermeter Response to Interharmonic Pollution
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Sep
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D. Gallo, C. Landi, R. Langella, A. Testa, "IEC Flickermeter Response to Interharmonic Pollution", in Proc. 11th Int. Conf. on Harmonics and Quality of Power, Sep. 2004, pp. 489-494.
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(2004)
Proc. 11th Int. Conf. on Harmonics and Quality of Power
, pp. 489-494
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Gallo, D.1
Landi, C.2
Langella, R.3
Testa, A.4
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8
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27144475333
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Power system subharmonics
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June
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A. Testa, R. Langella, "Power system subharmonics", in Proc. Power-Engineering Society General Meeting, vol. 3, pp. 2237-2242, June 2005.
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(2005)
Proc. Power-Engineering Society General Meeting
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, pp. 2237-2242
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Testa, A.1
Langella, R.2
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9
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27144507057
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Deficiency of the IEC Flicker Meter for Measuring Interharmonic-Caused Voltage Flickers
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June
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W. Xu, "Deficiency of the IEC Flicker Meter for Measuring Interharmonic-Caused Voltage Flickers", in Proc. Power Engineering Society General Meeting, vol. 3, n. 12, pp. 2326-2329, June 2005.
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(2005)
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, vol.3
, Issue.12
, pp. 2326-2329
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Xu, W.1
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11
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34648827903
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Detection of Flicker Caused by High-frequency Interharmonics
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Warsaw, Poland, 5 p, May 1-3
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T. Kim, A. Wang, E.J. Powers, W.M. Grady, A. Arapostathis, "Detection of Flicker Caused by High-frequency Interharmonics", in Proc. IEEE Instrumentation and Measurement Technology Conf. Warsaw, Poland, 5 p., May 1-3, 2007.
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(2007)
Proc. IEEE Instrumentation and Measurement Technology Conf
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Kim, T.1
Wang, A.2
Powers, E.J.3
Grady, W.M.4
Arapostathis, A.5
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12
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0346707417
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On the Processing of Harmonics and Interharmonics: Using Hanning Window in Standard Framework
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Jan
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A. Testa, D. Gallo, R. Langella, "On the Processing of Harmonics and Interharmonics: Using Hanning Window in Standard Framework", IEEE Trans. Power Del., vol. 19, n. 1, pp. 28-34, Jan. 2004.
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, pp. 28-34
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Testa, A.1
Gallo, D.2
Langella, R.3
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13
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0037250667
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Theoretical Assessment of Light Flicker Caused by Sub- and Interharmonic Frequencies
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Jan
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T. Keppler, N.R. Watson, J. Arrillaga, S. Chen, "Theoretical Assessment of Light Flicker Caused by Sub- and Interharmonic Frequencies", IEEE Trans. Power Del., vol. 18, n. 1, pp. 329-333, Jan. 2003.
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(2003)
IEEE Trans. Power Del
, vol.18
, Issue.1
, pp. 329-333
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Keppler, T.1
Watson, N.R.2
Arrillaga, J.3
Chen, S.4
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15
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54049088681
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Sectional approximation of flickermeter transformation characteristic for deformed modulating signal
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6 p, Oct
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G. Wiczyński, "Sectional approximation of flickermeter transformation characteristic for deformed modulating signal", in Proc. XII Int. Conf. on Harmonics and Quality of Power ICHQP 2006, 6 p., Oct. 2006.
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(2006)
Proc. XII Int. Conf. on Harmonics and Quality of Power ICHQP 2006
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Wiczyński, G.1
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