메뉴 건너뛰기




Volumn 25, Issue 1, 1998, Pages 19-24

Packaging of power electronics for high temperature applications

Author keywords

Capacitors; Electronic packaging; High temperature electronics; Power electronics; Semiconductors; Solders; Wirebonds

Indexed keywords


EID: 57649215870     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (7)

References (13)
  • 1
    • 0023569878 scopus 로고
    • High Temperature Microelectronics-Expanding the Applications for Smart Sensors
    • 87, held in Washington, D.C, December
    • R. B. Brown, F. L. Terry and K. C. Wu, "High Temperature Microelectronics-Expanding the Applications for Smart Sensors," International Electron Devices Meeting, IEDM '87, held in Washington, D.C., pg. 247, December 1987.
    • (1987) International Electron Devices Meeting, IEDM , pp. 247
    • Brown, R.B.1    Terry, F.L.2    Wu, K.C.3
  • 2
    • 77950041309 scopus 로고    scopus 로고
    • .3: Silicon Carbide
    • Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida
    • R. R. Siergiej, "Chapter 3.3: Silicon Carbide" in High Temperature Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida 1996.
    • (1996) High Temperature
    • Siergiej, R.R.1
  • 3
    • 77950037928 scopus 로고    scopus 로고
    • .4: Silicon-on-Insulator Technology
    • Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida
    • P. L. Brusius and M. Liu, "Chapter 2.4: Silicon-on-Insulator Technology" in High Temperature Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida, 1996.
    • (1996) High Temperature
    • Brusius, P.L.1    Liu, M.2
  • 8
    • 0342932918 scopus 로고
    • Electronic Packaging Materials and Their Properties
    • Systems, R. J. Hannemann, A. D. Kraus and M. G. Pecht, Editors, John Wiley & Sons, New York
    • M. G. Pecht and R. Agarwal, "Electronic Packaging Materials and Their Properties," Physical Architecture of VLSI Systems, R. J. Hannemann, A. D. Kraus and M. G. Pecht, Editors, John Wiley & Sons, New York, 1994.
    • (1994) Physical Architecture of VLSI
    • Pecht, M.G.1    Agarwal, R.2
  • 11
    • 0012653480 scopus 로고
    • Measurement of Diffusion Induced Strains at Metal Bond Interfaces
    • W. J. Takei and M. H. Francombe, "Measurement of Diffusion Induced Strains at Metal Bond Interfaces," Solid State Electronics, Vol. 11, pp. 205-208, 1968.
    • (1968) Solid State Electronics , vol.11 , pp. 205-208
    • Takei, W.J.1    Francombe, M.H.2
  • 13
    • 0003367919 scopus 로고    scopus 로고
    • P. McCluskey, D. Das, J. Jordan, L. Condra, T. C. Torri, J. Fink, and R. R. Grzybowski, Packaging of Electronics for High Temperature Environments, Paper accepted for Publication in The International Journal of Microcircuits and Electronic Packaging, IMAPS Publication, 20, No. 3, Third Issue, 1997.
    • P. McCluskey, D. Das, J. Jordan, L. Condra, T. C. Torri, J. Fink, and R. R. Grzybowski, "Packaging of Electronics for High Temperature Environments," Paper accepted for Publication in The International Journal of Microcircuits and Electronic Packaging, IMAPS Publication, Vol. 20, No. 3, Third Issue, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.