-
1
-
-
0023569878
-
High Temperature Microelectronics-Expanding the Applications for Smart Sensors
-
87, held in Washington, D.C, December
-
R. B. Brown, F. L. Terry and K. C. Wu, "High Temperature Microelectronics-Expanding the Applications for Smart Sensors," International Electron Devices Meeting, IEDM '87, held in Washington, D.C., pg. 247, December 1987.
-
(1987)
International Electron Devices Meeting, IEDM
, pp. 247
-
-
Brown, R.B.1
Terry, F.L.2
Wu, K.C.3
-
2
-
-
77950041309
-
.3: Silicon Carbide
-
Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida
-
R. R. Siergiej, "Chapter 3.3: Silicon Carbide" in High Temperature Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida 1996.
-
(1996)
High Temperature
-
-
Siergiej, R.R.1
-
3
-
-
77950037928
-
.4: Silicon-on-Insulator Technology
-
Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida
-
P. L. Brusius and M. Liu, "Chapter 2.4: Silicon-on-Insulator Technology" in High Temperature Electronics, F. P. McCluskey, R. R. Grzybowski, and T.F. Podlesak, Editors CRC Press, Boca Raton, Florida, 1996.
-
(1996)
High Temperature
-
-
Brusius, P.L.1
Liu, M.2
-
4
-
-
77950062709
-
The Performance of Polymer Capacitors at Elevated Temperatures
-
June
-
R. R. Grzybowski and F. P. McCluskey, "The Performance of Polymer Capacitors at Elevated Temperatures," Proceedings of the Third International High Temperature Electronics Conference, held in Albuquerque, New Mexico, pp. VI-15, June 1996.
-
(1996)
Proceedings of the Third International High Temperature Electronics Conference, held in Albuquerque, New Mexico, pp. VI-15
-
-
Grzybowski, R.R.1
McCluskey, F.P.2
-
5
-
-
3943108090
-
Packaging Considerations for High Temperature Operation
-
June
-
H. K. Charles, Jr. and G. V. Clatterbaugh, "Packaging Considerations for High Temperature Operation," Proceedings of the Second International High Temperature Electronics Conference, held in Charlotte, North Carolina, pg. IX-3, June 1994.
-
(1994)
Proceedings of the Second International High Temperature Electronics Conference, held in Charlotte, North Carolina, pg. IX-3
-
-
Charles Jr., H.K.1
Clatterbaugh, G.V.2
-
6
-
-
3943076426
-
Aluminum Nitride Package for High Temperature Applications
-
held in Albuquerque, New Mexico
-
M. Bratcher, R. J. Yoon, and W. Whitworth, "Aluminum Nitride Package for High Temperature Applications," Proc. Third Int'l High Temperature Electronics Conference, held in Albuquerque, New Mexico, 1996.
-
(1996)
Proc. Third Int'l High Temperature Electronics Conference
-
-
Bratcher, M.1
Yoon, R.J.2
Whitworth, W.3
-
8
-
-
0342932918
-
Electronic Packaging Materials and Their Properties
-
Systems, R. J. Hannemann, A. D. Kraus and M. G. Pecht, Editors, John Wiley & Sons, New York
-
M. G. Pecht and R. Agarwal, "Electronic Packaging Materials and Their Properties," Physical Architecture of VLSI Systems, R. J. Hannemann, A. D. Kraus and M. G. Pecht, Editors, John Wiley & Sons, New York, 1994.
-
(1994)
Physical Architecture of VLSI
-
-
Pecht, M.G.1
Agarwal, R.2
-
11
-
-
0012653480
-
Measurement of Diffusion Induced Strains at Metal Bond Interfaces
-
W. J. Takei and M. H. Francombe, "Measurement of Diffusion Induced Strains at Metal Bond Interfaces," Solid State Electronics, Vol. 11, pp. 205-208, 1968.
-
(1968)
Solid State Electronics
, vol.11
, pp. 205-208
-
-
Takei, W.J.1
Francombe, M.H.2
-
13
-
-
0003367919
-
-
P. McCluskey, D. Das, J. Jordan, L. Condra, T. C. Torri, J. Fink, and R. R. Grzybowski, Packaging of Electronics for High Temperature Environments, Paper accepted for Publication in The International Journal of Microcircuits and Electronic Packaging, IMAPS Publication, 20, No. 3, Third Issue, 1997.
-
P. McCluskey, D. Das, J. Jordan, L. Condra, T. C. Torri, J. Fink, and R. R. Grzybowski, "Packaging of Electronics for High Temperature Environments," Paper accepted for Publication in The International Journal of Microcircuits and Electronic Packaging, IMAPS Publication, Vol. 20, No. 3, Third Issue, 1997.
-
-
-
|