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Volumn 44, Issue 11, 2008, Pages 76-79
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Innovations in ellipsometry facilitate thin-film analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
FAIL CRITERIONS;
FILM ANALYSIS;
LEVENBERG-MARQUARDT ALGORITHMS;
LINEAR POLARIZERS;
NOVICE USERS;
ORGANIC FILMS;
SEMI-CONDUCTORS;
SPECTROSCOPIC ELLIPSOMETER;
WAVE PLATES;
ELLIPSOMETRY;
OPTICAL CONSTANTS;
PEELING;
POLARIZATION;
SEMICONDUCTING ORGANIC COMPOUNDS;
SPECTROSCOPIC ANALYSIS;
SPECTROSCOPIC ELLIPSOMETRY;
SPONTANEOUS EMISSION;
THICKNESS MEASUREMENT;
OPTICAL FILMS;
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EID: 57449102046
PISSN: 10438092
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (3)
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