On-chip cancellation of parasitic effects for dielectric permittivity measurement

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2008, Pages 131-134

  Song, Chunrong ^a   Wang, Pingshan ^a  

^a Clemson University   (United States)

Author keywords

Planar transmission lines; Power dividers; Scattering parameters; Sensitivity; Sensors

Indexed keywords

MICROWAVES; PERMITTIVITY; PERMITTIVITY MEASUREMENT;

DIELECTRIC PERMITTIVITIES; DIELECTRIC PERMITTIVITY MEASUREMENTS; MEASUREMENT SENSITIVITIES; NEW APPROACHES; ON CHIPS; PARASITIC EFFECTS; PLANAR TRANSMISSION LINES; POWER DIVIDERS; SENSITIVITY; SIMULATION RESULTS; TEST STRUCTURES;

MICROWAVE POWER TRANSMISSION;

EID: 57349195644     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2008.4633317     Document Type: Conference Paper

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