Land-contrast self-referencing interferometric protein microarray

Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

  Wang, Xuefeng ^a   Zhao, Ming ^a   Nolte, David D ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON COMPOUNDS; SILICON WAFERS;

OXIDIZED SILICON WAFERS; PATTERNED SUBSTRATES; PROTEIN LAYERS; PROTEIN MICROARRAYS; QUADRATURE RESPONSES; REFLECTOMETRY; SPOT PATTERNS;

INTERFEROMETRY;

EID: 57349190164     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3040303     Document Type: Article

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