Modeling device manufacturing uncertainty in electromagnetic simulations

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2008, Pages 1385-1388

  De Menezes, Leonardo R A X ^a   Paredes, Abraham O ^a   Abdalla Jr , Humberto ^a   Borges, Geovany A ^a  

^a UNIVERSITY OF BRASILIA   (Brazil)

Author keywords

Electromagnetic fields; Monte Carlo methods; Stochastic processes

Indexed keywords

CLUSTER ANALYSIS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELDS; ELECTROMAGNETISM; INDUSTRIAL APPLICATIONS; MAGNETIC MATERIALS; MICROWAVE DEVICES; MICROWAVES; MONTE CARLO METHODS; RANDOM VARIABLES;

COMPUTATIONAL RESOURCES; ELECTROMAGNETIC SIMULATIONS; ELLIPTIC FILTERS; EM SIMULATIONS; MANUFACTURING UNCERTAINTIES; MICROSTRIP; MODELING DEVICES; STOCHASTIC PROCESSES; TOLERANCE ERRORS; UNSCENTED TRANSFORMS;

ELECTROMAGNETIC WAVES;

EID: 57349175671     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2008.4633036     Document Type: Conference Paper

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