TEM characterization of VLS-grown ZnTe nanowires

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 12, 2008, Pages 3780-3784

  Kirmse, H ^a   Neumann, W ^a   Kret, S ^b   Dluzewski P ^b   Janik, E ^b   Karczewski, G ^b   Wojtowicz, T ^b  

^a HUMBOLDT UNIVERSITY   (Germany)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS LAYERS; FORMATION PROCESSES; LATERAL GROWTHS; ONEDIMENSIONAL GROWTHS; SIDE-WALLS; TEM CHARACTERIZATIONS;

CRYSTALLOGRAPHY; DROP FORMATION; DROPS; ELECTRIC WIRE; GROWTH (MATERIALS); NANOCRYSTALS; NANOTECHNOLOGY; NANOWIRES; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; STACKING FAULTS; THICKNESS MEASUREMENT; WIRE; ZINC COMPOUNDS; ZINC OXIDE;

NANOELECTRONICS;

EID: 57349165792     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200780197     Document Type: Conference Paper

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