Generating pairwise combinatorial test set using artificial parameters and values

Proceedings - International Symposium on Information Technology 2008, ITSim

Volumn 4, Issue , 2008, Pages

  Younis, Mohammed I ^a   Zamli, Kamal Z ^a   Isa, Nor Ashidi Mat ^a  

^a SCHOOL OF CHEMICAL ENGINEERING   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; INFORMATION TECHNOLOGY; TESTING;

ARTIFICIAL PARAMETERS; COMBINATORIAL EXPLOSIONS; COMBINATORIAL TESTS; HIGHER ORDERS; INPUT PARAMETERS; LINES OF CODES; MARKET DEMANDS; PAIRWISE TESTS; QUALITY SOFTWARES; SAMPLING STRATEGIES; SOFTWARE ENGINEERS; SYSTEM CONDITIONS; TEST COVERAGES; TEST DATUMS; TEST PARAMETERS; TEST SETS; UNDER PRESSURES;

STATISTICAL TESTS;

EID: 57349162199     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITSIM.2008.4632001     Document Type: Conference Paper

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