System identification using slow and irregular output samples

Journal of Process Control

Volumn 19, Issue 1, 2009, Pages 58-67

  Zhu, Yucai ^a   Telkamp, Herman ^b   Wang, Jinghua ^c   Fu, Qingling ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Sinopec Guangzhou Refinery ^*  (Netherlands)

^c SINOPEC   (China)

Author keywords

Bias distribution; Identification; Inferential model; Minimum variance; Output error method

Indexed keywords

BIAS DISTRIBUTION; IDENTIFICATION; INFERENTIAL MODEL; MINIMUM VARIANCE; OUTPUT ERROR METHOD;

EID: 57349142962     PISSN: 09591524     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jprocont.2008.02.002     Document Type: Article

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