Application of dual-rate modeling to CCR octane quality inferential control

IEEE Transactions on Control Systems Technology

Volumn 11, Issue 1, 2003, Pages 43-51

  Li, Dongguang ^a   Shah, Sirish L ^b   Chen, Tongwen ^b   Qi, Kent Z ^c  

^a HONEYWELL   (United States)

^b UNIVERSITY OF ALBERTA   (Canada)

^c Shell Canada Products Limited   (Canada)

Author keywords

Identification; Industrial applications; Inferential control; Multirate systems; Process control

Indexed keywords

ALGORITHMS; ANTIKNOCK RATING; AUTOMATION; INDUSTRIAL APPLICATIONS; PREDICTIVE CONTROL SYSTEMS; PROCESS CONTROL;

DUAL-RATE MODELING;

QUALITY CONTROL;

EID: 0037272088     PISSN: 10636536     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCST.2002.806433     Document Type: Article

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