Piezoresponse force microscopy on doubly clamped KNbO3 nanowires

Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

  Wang, J ^a   Stampfer, C ^b   Roman, C ^b   Ma, W H ^a   Setter, N ^a   Hierold, C ^b  

^a EPFL   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRES; NIOBIUM COMPOUNDS; PIEZOELECTRICITY; POTASSIUM; SILICON COMPOUNDS; SMELTING;

DIFFERENT DOMAINS; ELECTRICAL FIELDS; METAL ELECTRODES; MULTIDOMAIN STRUCTURES; NANOWIRE AXIS; PIEZOELECTRIC COEFFICIENTS; PIEZOELECTRIC DISPLACEMENTS; PIEZORESPONSE FORCE MICROSCOPIES; POTASSIUM NIOBATE;

ELECTRIC WIRE;

EID: 57349126331     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3000385     Document Type: Article

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