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Volumn 44, Issue 25, 2008, Pages 1487-1488

Use of nBn structures to suppress surface leakage currents in unpassivated InAs infrared photodetectors

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM ARSENIDE; LEAKAGE CURRENTS; PHOTODETECTORS; SEMICONDUCTING INDIUM; SEMICONDUCTOR JUNCTIONS;

EID: 57349113316     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20082925     Document Type: Article
Times cited : (86)

References (13)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.