Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime

Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

  Lee, Hyun Seok ^a,b   Lee, Taek Sung ^a   Lee, Yongwoon ^c   Kim, Jooho ^c   Lee, Suyoun ^a   Huh, Joo Youl ^b   Kim, Donghwan ^b   Cheong, Byung Ki ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Korea University   (South Korea)

^c SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ACQUISITION; LASERS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; TELLURIUM COMPOUNDS; THICK FILMS;

AMORPHOUS BANDS; BLUE LASERS; BLUE LIGHTS; COMBINED ANALYSIS; IRRADIATED FILMS; MICROSTRUCTURAL; NONLINEAR OPTICAL EFFECTS; OPTICAL ANALYSIS; SATURABLE ABSORPTIONS; STATIC TESTS; SUPER RESOLUTIONS; SUPERRESOLUTION;

GERMANIUM;

EID: 57349112347     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3040695     Document Type: Article

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