Deriving distance metrics from generality relations

Pattern Recognition Letters

Volumn 30, Issue 3, 2009, Pages 187-191

  De Raedt, Luc ^a   Ramon, Jan ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Distance metric; General specific ordering; Size function based metric

Indexed keywords

FEATURE EXTRACTION; LEARNING SYSTEMS; PATTERN RECOGNITION; TREES (MATHEMATICS);

DISTANCE METRIC; DISTANCE METRICS; GENERAL-SPECIFIC ORDERING; MACHINE LEARNINGS; MILD CONDITIONS; PARTIAL ORDERS; SIZE-FUNCTION BASED METRIC;

GRAPH THEORY;

EID: 57249103315     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2008.09.007     Document Type: Article

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