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Volumn 5256 LNCS, Issue , 2008, Pages 86-104

Requirements coverage as an adequacy measure for conformance testing

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER SCIENCE; COMPUTERS;

EID: 57149114395     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-88194-0_8     Document Type: Conference Paper
Times cited : (17)

References (21)
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    • September
    • Chilenski, J.J., Miller, S.P.: Applicability of Modified Condition/Decision Coverage to Software Testing. Software Engineering Journal, 193-200 (September 1994)
    • (1994) Software Engineering Journal , pp. 193-200
    • Chilenski, J.J.1    Miller, S.P.2
  • 7
    • 84887479765 scopus 로고    scopus 로고
    • Using model checking to generate tests from requirements specifications
    • Gargantini, A., Heitmeyer, C.: Using model checking to generate tests from requirements specifications. Software Engineering Notes 24(6), 146-162 (1999)
    • (1999) Software Engineering Notes , vol.24 , Issue.6 , pp. 146-162
    • Gargantini, A.1    Heitmeyer, C.2
  • 9
    • 0006562330 scopus 로고    scopus 로고
    • A practical tutorial on modified condition/decision coverage
    • Technical Report TM-2001-210876, NASA
    • Hayhurst, K.J., Veerhusen, D.S., Rierson, L.K.: A practical tutorial on modified condition/decision coverage. Technical Report TM-2001-210876, NASA (2001)
    • (2001)
    • Hayhurst, K.J.1    Veerhusen, D.S.2    Rierson, L.K.3
  • 12
    • 57049160640 scopus 로고    scopus 로고
    • Mathworks Inc
    • Mathworks Inc. Simulink product web site, http://www.mathworks.com/ products/simulink
    • Simulink product web site
  • 13
    • 48349138625 scopus 로고    scopus 로고
    • The NuSMV Toolset (2005), http://nusmv.irst.itc.it/
    • (2005) The NuSMV Toolset
  • 14
    • 0031222042 scopus 로고    scopus 로고
    • Automatically detecting equivalent mutants and infeasible paths
    • Offutt, A.J., Pan, J.: Automatically detecting equivalent mutants and infeasible paths. Software Testing, Verification & Reliability 7(3), 165-192 (1997)
    • (1997) Software Testing, Verification & Reliability , vol.7 , Issue.3 , pp. 165-192
    • Offutt, A.J.1    Pan, J.2
  • 16
    • 57349094806 scopus 로고    scopus 로고
    • Rajan, A., Whalen, M.W., Heimdahl, M.P.E.: The Effect of Program and Model Structure on MC/DC Test Adequacy Coverage. In: Proceedings of 30th International Conference on Software Engineering (ICSE) (to appear, 2008), http://crisys.cs.umn.edu/ICSE08.pdf
    • Rajan, A., Whalen, M.W., Heimdahl, M.P.E.: The Effect of Program and Model Structure on MC/DC Test Adequacy Coverage. In: Proceedings of 30th International Conference on Software Engineering (ICSE) (to appear, 2008), http://crisys.cs.umn.edu/ICSE08.pdf
  • 20
    • 57149116122 scopus 로고    scopus 로고
    • RTCA. DO-178B: Software Consideration. In: Airborne Systems and Equipment Certification. RTCA (1992)
    • RTCA. DO-178B: Software Consideration. In: Airborne Systems and Equipment Certification. RTCA (1992)
  • 21
    • 34247380754 scopus 로고    scopus 로고
    • Whalen, M.W., Rajan, A., Heimdahl, M.P.E.: Coverage metrics for requirements- based testing. In: Proceedings of International Symposium on Software Testing and Analysis (July 2006)
    • Whalen, M.W., Rajan, A., Heimdahl, M.P.E.: Coverage metrics for requirements- based testing. In: Proceedings of International Symposium on Software Testing and Analysis (July 2006)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.