Distinguished paper: The effect of program and model structure on MC/DC test adequacy coverage

Proceedings - International Conference on Software Engineering

Volumn , Issue , 2008, Pages 161-170

  Rajan, Ajitha ^a   Whalen, Michael W ^b   Heimdahl, Mats P E ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

^b ROCKWELL COLLINS   (United States)

Author keywords

Experimentation; Verification

Indexed keywords

CRITICAL SYSTEMS; EXPERIMENTATION; HIGHLY SENSITIVES; MODEL-BASED DEVELOPMENT; PROGRAM STRUCTURES; REALISTIC SYSTEMS; SOURCE CODES; STATISTICAL SIGNIFICANCES; TEST ADEQUACY CRITERION; VERIFICATION; HIGHLY SENSITIVE; INLINING; MODEL BASED DEVELOPMENT; STATISTICAL SIGNIFICANCE; TEST ADEQUACY CRITERIA;

AIRCRAFT INSTRUMENTS; AVIONICS; SOFTWARE ENGINEERING; COMPUTER SOFTWARE;

TESTING;

EID: 57349094806     PISSN: 02705257     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1368088.1368111     Document Type: Conference Paper

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