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Volumn , Issue , 2005, Pages 484-486
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Characteristics of CdTe films of different compositions fabricated by CMBD
a b b b b a b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
ATMOSPHERIC PRESSURE;
CADMIUM COMPOUNDS;
CHARACTERIZATION;
ELECTRODEPOSITION;
GRAIN GROWTH;
HYDROGEN;
MOLECULAR BEAM EPITAXY;
SCANNING ELECTRON MICROSCOPY;
STOICHIOMETRY;
X RAY DIFFRACTION ANALYSIS;
CADMIUM TELLURIDE OXIDES;
CHEMICAL MOLECULAR BEAM DEPOSITION (CMBD);
STOICHIOMETRIC COMPOSITIONS;
THIN FILMS;
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EID: 27944503630
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (4)
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