The use of XPS spectra for the study of reaction mechanisms: The atom inventory method

Journal of Physical Organic Chemistry

Volumn 21, Issue 12 SPEC. ISS., 2008, Pages 1035-1042

  Humeres, Eduardo ^a   De Castro, Karen Mendes ^a   De F P M Moreira, Regina ^a   Schreiner, Wido H ^b   Aliev, Abil E ^c   Canle, Moisés ^d   Santaballa, J Arturo ^d   Fernández, Isabel ^d  

^a FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c UNIVERSITY COLLEGE LONDON   (United Kingdom)

^d UNIVERSITY OF A CORUÑA   (Spain)

Author keywords

Activated carbon; Basic hydrolysis; Intermediate reactivity; Intermediates; Mechanisms on solids surfaces; Photolysis; Solid surface; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; CHARCOAL; ELECTRON SPECTROSCOPY; HYDROLYSIS; IONS; NEGATIVE IONS; ORGANIC CARBON; ORGANIC COMPOUNDS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTOLYSIS; PHOTONS; PHYSICAL CHEMISTRY; SPECTRUM ANALYSIS; SULFUR DIOXIDE; SURFACE ANALYSIS; SURFACE CHEMISTRY; SURFACE REACTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC COMPOSITIONS; BASIC HYDROLYSIS; CARBON MATRIXES; EPISULFIDE; HYDROXIDE IONS; HYPOTHETICAL MECHANISMS; INTERMEDIATE REACTIVITY; INTERMEDIATES; LASER PHOTOLYSISES; LIQUID REACTIONS; MECHANISTIC STUDIES; ORGANIC MOIETIES; RADICAL ANIONS; REACTION MECHANISMS; SOLID SURFACE; SOLID SURFACES; SURFACE ATOMIC COMPOSITIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS SPECTRUMS;

ACTIVATED CARBON;

EID: 57049127738     PISSN: 08943230     EISSN: 10991395     Source Type: Journal    
DOI: 10.1002/poc.1392     Document Type: Article

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