Subwavelength imaging based on frequency scanning

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Maslovski, Stanislav ^a   Alitalo, Pekka ^b   Tretyakov, Sergei ^b  

^a PETER THE GREAT ST PETERSBURG POLYTECHNIC UNIVERSITY   (Russian Federation)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED ARRAYS; EXTERNAL FIELDS; FREQUENCY SCANS; MOVING PARTS; NEAR FIELDS; POST-PROCESSING; RESONANT PARTICLES; SPATIAL PROFILES; SUB WAVELENGTHS; SUBWAVELENGTH IMAGING; TWO POINTS;

SCANNING;

EID: 57049124869     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3021056     Document Type: Article

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