Ultra-sensitive autocorrelation of 1.5 μm light with single photon counting silicon avalanche photodiode

Electronics Letters

Volumn 38, Issue 2, 2002, Pages 86-88

  Xu, C ^a   Roth, J M ^b   Knox, W H ^c   Bergman, K ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b Princeton University   (United States)

^c UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUOUS WAVE LASERS; CORRELATION DETECTORS; FIBER LASERS; LASER PULSES; LIGHT ABSORPTION; PHOTONS; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; SIGNAL TO NOISE RATIO;

PHOTON ABSORPTION; SINGLE PHOTON COTING SILICON AVALANCHE PHOTODIODE; ULTRA-SENSITIVE AUTOCORRELATION;

AVALANCHE DIODES;

EID: 0037122884     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20020034     Document Type: Article

References (6)

1. Autocorrelation and ultrafast optical thresholding at 1.5 μm using a commercial InGaAsP 1.3 μm laser diode
2. The two-photon absorption semiconductor waveguide autocorrelation
3. Highly sensitive interferometric autocorrelator using Si avalanche photodiode as two-photon absorber
4. Single photon avalanche diode for single molecule detection
5. Commercial semiconductor devices for two photon absorption autocorrelation of ultrashort light pulses
6. Comparison of one- and two-photon optical beam-induced current imaging