Electronic structure of Ag-induced atomic wires on Si(5 5 7) investigated by STS and angle-resolved photoemission

Surface Science

Volumn 602, Issue 24, 2008, Pages 3745-3749

  Morikawa, Harumo ^a   Kang, Pil Gyu ^a   Yeom, Han Woong ^a  

^a Yonsei University   (South Korea)

Author keywords

Angle resolved photoemission; Low energy electron diffraction (LEED); Scanning tunneling microscopy; Silicon; Silver

Indexed keywords

ADSORPTION; ATOMIC PHYSICS; ATOMS; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; PHOTOELECTRICITY; PHOTOEMISSION; SCANNING; SCANNING TUNNELING MICROSCOPY; SILICON; SILVER; WIRE;

1D STRUCTURES; ANGLE-RESOLVED PHOTOEMISSION; ATOMIC WIRES; BAND GAPS; DO-MAINS; INVERSE PHOTOEMISSIONS; LOW ENERGY ELECTRON DIFFRACTION (LEED); STEP EDGES; STM/STS;

CRYSTAL ATOMIC STRUCTURE;

EID: 57049098089     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.09.044     Document Type: Article

References (23)

1. Yeom H.W., Takeda S., Rotenberg E., Matsuda I., Horikoshi K., Schaefer J., Lee C.M., Kevan S.D., Ohta T., Nagao T., and Hasegawa S. Phys. Rev. Lett. 82 (1999) 4898
2. Tomonaga S. Prog. Theor. Phys. 5 (1950) 544
3. Luttinger J.M. J. Math. Phys. 4 (1963) 1154
4. Park S.J., Yeom H.W., Ahn J.R., and Lyo I.-W. Phys. Rev. Lett. 95 (2005) 126102
5. Lee G., Guo J., and Plummer E.W. Phys. Rev. Lett. 95 (2005) 116103
6. Morikawa H., Matsuda I., and Hasegawa S. Phys. Rev. B 70 (2004) 085412
7. Losio R., Altmann K.N., Kirakosian A., Lin J.-L., Petrovykh D.Y., and Himpsel F.J. Phys. Rev. Lett. 86 (2001) 4632
8. Kirakosian A., Bennewitz R., Crain J.N., Fauster Th., Lin J.-L., Petrovykh D.Y., and Himpsel F.J. Appl. Phys. Lett. 79 (2001) 1608
9. Kim K.S., Choi W.H., and Yeom H.W. Phys. Rev. B 75 (2007) 195324
10. Morikawa H., Kim K.S., Jung D.Y., and Yeom H.W. Phys. Rev. B 76 (2007) 165406
11. Ahn J.R., Yeom H.W., Yoon H.S., and Lyo I.-W. Phys. Rev. Lett. 91 (2003) 196403
12. Tegenkamp C., Kallassy Z., Pfnür H., Günter H.-L., Zielasek V., and Henzler M. Phys. Rev. Lett. 95 (2005) 176804
13. Ahn J.R., Kim Y.J., Lee H.S., Hwang C.C., Kim B.S., and Yeom H.W. Phys. Rev. B 66 (2002) 153403
14. Baski A.A., Saoud K.M., and Jones K.M. Appl. Surf. Sci. 182 (2001) 216
15. Baski A.A., Saoud K.M., and Jones K.M. Ultramicroscopy 86 (2001) 23
16. Lipton-Duffin J.A., Mark A.G., MacLeod J.M., and McLean A.B. Phys. Rev. B 77 (2008) 125419
17. Oh D.-H., Kim M.K., Nam J.H., Song I., Park C.-Y., Woo S.H., Hwang H.-N., Hwang C.C., and Ahn J.R. Phys. Rev. B 77 (2008) 155430
18. Hoque E., Petkova A., and Henzler M. Surf. Sci. 515 (2002) 312
19. Teys S.A., Romanyuk K.N., Zhachuk R.A., and Olshanetsky B.Z. Surf. Sci. 600 (2006) 4878
20. Krawiec M., Kwapiński T., and Jałochowski M. Phys. Rev. B 73 (2006) 075415
21. Yeom H.W., Ahn J.R., Yoon H.S., Lyo I.-W., Jeong H., and Jeong S. Phys. Rev. B 72 (2005) 035323
22. Riikonen S., and Sánchez-Portal D. Phys. Rev. B 76 (2007) 035410
23. Kuntze J., Mugarza A., and Ortega J.E. Appl. Phys. Lett. 81 (2002) 2463