Temperature-dependent and pump-probe ellipsometric studies of TlInSe2

Thin Solid Films

Volumn 517, Issue 4, 2008, Pages 1434-1438

  Mamedov, Nazim ^a   Wakita, Kazuki ^b   Shim, YongGu ^c   Abe, Kouji ^c   Ogushi, Naoki ^c  

^a INSTITUTE OF PHYSICS   (Azerbaijan)

^b CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

^c Osaka Prefecture University   (Japan)

Author keywords

Ellipsometry; Extinction coefficient; Incommensurate phase; Refractive index; Reversible surface profile change; Thermal conductivity; TlInSe2

Indexed keywords

ELLIPSOMETRY; LIGHT REFRACTION; OPTICAL PROPERTIES; ORGANIC POLYMERS; PHOTONS; PUMPING (LASER); PUMPS; REFRACTIVE INDEX; REFRACTOMETERS; SPECTROSCOPIC ELLIPSOMETRY; THERMOELECTRICITY;

CRYSTALLINE STRUCTURES; ELASTIC EFFECTS; EXTINCTION COEFFICIENT; EXTINCTION COEFFICIENTS; INCOMMENSURATE PHASE; LASER ELLIPSOMETRIES; PHOTON ENERGIES; PUMPING POWERS; REVERSIBLE CHANGES; REVERSIBLE SURFACE PROFILE CHANGE; SINGLE WAVELENGTHS; SOLITON WAVES; SURFACE PROFILES; TLINSE2;

PHASE TRANSITIONS;

EID: 56949092727     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.09.012     Document Type: Article

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