Comparative XPS surface study of polyaniline thin films

Solid State Ionics

Volumn 179, Issue 39, 2008, Pages 2234-2239

  Golczak, Sebastian ^a   Kanciurzewska, Anna ^a   Fahlman, Mats ^b   Langer, Krzysztof ^a   Langer, Jerzy J ^a  

^a ADAM MICKIEWICZ UNIVERSITY   (Poland)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Degradation; Electropolymerization; Polyaniline; SEM; X ray photoelectron spectroscopy

Indexed keywords

AMINES; CHEMICAL OXYGEN DEMAND; ELECTRON SPECTROSCOPY; ELECTROPOLYMERIZATION; MICROSCOPIC EXAMINATION; NITROGEN; NITROGEN COMPOUNDS; ORGANIC COMPOUNDS; OXIDATION; PHOTODEGRADATION; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; POLYANILINE; SPECTRUM ANALYSIS; SURFACE MORPHOLOGY; SURFACES; THICK FILMS; THIN FILMS;

AMINE NITROGENS; BENZOQUINONE; MICRO RODS; MICROPOROUS STRUCTURES; OXIDATION STATES; PANI FILMS; PERIODIC NETWORKS; POLYANILINE FILMS; POLYANILINE THIN FILMS; SEM; SIDE PRODUCTS; STRUCTURAL CHANGES; SURFACE COMPOSITIONS; SURFACE LAYERS; SURFACE STUDIES; THINNER FILMS; UNIFORM STRUCTURES; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 56949090385     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2008.08.004     Document Type: Article

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