Determining patch saliency using low-level context

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5303 LNCS, Issue PART 2, 2008, Pages 446-459

  Parikh, Devi ^a   Zitnick, C Lawrence ^b   Chen, Tsuhan ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b MICROSOFT RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OBJECT RECOGNITION;

BAG OF FEATURES; HIGH-LEVEL REASONING; RANDOM SAMPLING; RECOGNITION ACCURACY; SALIENCY MEASURE; SAMPLING DENSITIES; SEQUENTIAL APPROACH; SPATIAL INFORMATIONS;

COMPUTER VISION;

EID: 56749152080     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-88688-4_33     Document Type: Conference Paper

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