Comparing salient point detectors

Pattern Recognition Letters

Volumn 24, Issue 1-3, 2003, Pages 89-96

  Sebe, Nicu ^a   Lew, Michael S ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

Author keywords

Corner detectors; Information content; Repeatability rate; Wavelet based salient points

Indexed keywords

DETECTORS; IMAGE ANALYSIS; WAVELET TRANSFORMS;

SALIENT POINTS DETECTORS;

PATTERN RECOGNITION;

COMPUTER VISION;

EID: 0037233469     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(02)00192-7     Document Type: Article

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