Coverage-driven automatic test generation for UML activity diagrams

Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Volumn , Issue , 2008, Pages 139-142

  Chen, Mingsong ^a   Mishra, Prabhat ^a   Kalita, Dhrubajyoti ^b  

^a University of Florida   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Test generation; UML activity diagrams

Indexed keywords

AUTOMATED TECHNIQUES; AUTOMATED TEST GENERATIONS; AUTOMATIC TEST GENERATIONS; DESIGN MODELS; DIRECTED TESTS; EMBEDDED SYSTEM DESIGNS; SPECIFICATION COVERAGES; SYSTEM LEVELS; TEST GENERATION; UML ACTIVITY DIAGRAMS;

GRAPHIC METHODS; INTEGRATED CIRCUITS; JAVA PROGRAMMING LANGUAGE; LAKES; MODEL CHECKING; SOFTWARE TESTING; SPECIFICATIONS; SYSTEMS ANALYSIS; TESTING; UNIFIED MODELING LANGUAGE;

EMBEDDED SYSTEMS;

EID: 56749148206     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1366110.1366145     Document Type: Conference Paper

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